solar cell / scattering sample measurement option L-SCAT
Rough scattering samples common in the solar cell industry are difficult to measure accurately with most ellipsometers because of the loss of signal strength and depolarization of the measurement beam.  Gaertner Stokes Ellipsometers measure all 4 stokes parameters S0, s1, s2, s3. for a complete state of polarization measurement  giving highly accurate film thickness and index together with a hardware modification.

stokes ellipsometer LSE-TRAVELER
The LSE –TRAVELER is designed to be shipped or checked as airline luggage, the rugged LSE-TRAVELER fits into a airline safe foam filled travel case together with sample table and a PCMCIA interfaced notebook computer that is ready for measurement right out of the case.

break-thru pricing under $50K for stokes imaging ellipsometer LSE-WS
The Stokes WAFERSKAN Ellipsometer LSE-WS is super fast, measuring 49 sites on wafers up to 300mm in less than 49 seconds. It uses advanced technology to give precise 2D/3D image maps of film thickness and index.  Priced under $50K, the Stokes WAFERSKAN LSE-WS is an outstanding value in a high performance ellipsometer.

ellipsometer upgrades for Windows 2000/XP
Older Gaertner ellipsometer models L116,L116A, and L116B with Hewlett Packard computers can be upgraded to computers with Windows software. Old WAFERSKAN models L115A, L115B and L115C with Hewlett-Packard computers can be upgraded to IBM PC or compatible computers using new LGEMP software giving  2D/3D color image maps.

xy digital measuring microscope W126
The model W126 provides 2 x 6 inch measurements using electronic micrometer heads and a Quadra-Chek readout. Geometric capabilities include radius-diameter, centerline, polar/cartesian, skew alignment, linear error correction, inch/metric conversion to handle most of your measurement needs. Priced at $16K.

micrometer slide with electronic readout
The model M303LE has a 4 inch range, linear encoder and inch/metric digital electronic readout standard.

electronic readout for microscopes
The model M202E inch/metric digital electronic readout can be added to virtually any microscope to speed measurements and improve accuracy. 

ellipsometer exhibits
See our ellipsometers at SEMICON JAPAN in Tokyo in December